Bridge Structures is an esteemed academic journal dedicated to the field of structural engineering, particularly focusing on the design, analysis, and maintenance of bridge systems. Published by IOS PRESS, a reputable publisher known for its contributions to various scientific fields, the journal serves as an integral platform for disseminating innovative research and advancements within the domain. With an ISSN of 1573-2487 and an E-ISSN of 1744-8999, Bridge Structures has established itself over the years—covering contributions from 2005 to 2024. The journal has attained a commendable ranking within the Q3 category in Building and Construction and holds a position within the 28th percentile among its peers according to the Scopus rankings. Though the journal operates on a subscription basis, its commitment to advancing engineering knowledge is paramount, making it essential reading for researchers, practitioners, and students eager to deepen their understanding of bridge engineering. The journal not only explores theoretical advancements but also emphasizes practical applications, providing a well-rounded perspective on current challenges and solutions in the field of bridge structures.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is a leading academic journal published by SPRINGER, dedicated to advancing the field of electronic testing through innovative research and applications. With an ISSN of 0923-8174 and an E-ISSN of 1573-0727, this journal plays a vital role in disseminating significant findings and methodologies that enhance the reliability and performance of electronic systems. Based in the Netherlands, with a prominent address at ONE NEW YORK PLAZA, SUITE 4600, NEW YORK, NY 10004, UNITED STATES, the journal covers a broad spectrum of topics related to electronic testing, making it essential reading for researchers, professionals, and students in the Electrical and Electronic Engineering domain. In the 2023 ranking, it holds a Category Quartile of Q3 and is ranked #495 out of 797 journals in Scopus, reflecting its contributions to the discipline. Although it does not provide open access options, readers and contributors can engage with high-caliber research from 1990 through to 2024, further emphasizing its commitment to the ongoing evolution of electronic testing methodologies.

The Japanese Journal of Applied Physics is a premier publication in the field of applied physics, offering a platform for researchers and professionals to present their findings and innovations. Published by IOP Publishing Ltd, this esteemed journal has been active since 1963 and continues to contribute significantly to the understanding and advancement of applied physics across diverse applications. The journal is recognized for its rigorous peer-review process and high-quality publications, evidenced by its 2023 ranking of Q2 in Engineering (Miscellaneous) and Q3 in Physics and Astronomy (Miscellaneous). With an accessible ISSN of 0021-4922 and E-ISSN 1347-4065, the journal cultivates a global readership, fostering collaboration and innovation within the scientific community. Although the journal does not currently offer open access options, its valuable insights into the latest technological advancements and theoretical developments remain crucial for students, researchers, and industry professionals alike. By bridging the gap between fundamental physics and practical applications, the Japanese Journal of Applied Physics plays a vital role in shaping the future of applied sciences in Japan and beyond.

MICROELECTRONICS RELIABILITY, published by PERGAMON-ELSEVIER SCIENCE LTD, is a pivotal journal that serves the advancing field of microelectronics and materials reliability. With its ISSN 0026-2714 and E-ISSN 1872-941X, this journal has been at the forefront of disseminating research since its inception in 1962 and is set to continue exploring cutting-edge topics through 2024. The journal holds a respectable presence across several categories, achieving a Q3 ranking in areas such as Atomic and Molecular Physics and Electrical and Electronic Engineering, highlighting its broad interdisciplinary appeal, while also ranking in the Q2 category for Safety, Risk, Reliability, and Quality, which speaks to its commitment to ensuring standards in technological advancements. Access to this journal is subscription-based, making it an essential resource for researchers, professionals, and students seeking reliable information and data regarding electronic material performance and reliability assessment. Located in Kidlington, Oxford, UK, MICROELECTRONICS RELIABILITY is dedicated to advancing the field and addressing the critical issues associated with the reliability of microelectronic devices, thereby supporting innovations that shape our technological future.

The Journal of Semiconductor Technology and Science, published by the IEEK PUBLICATION CENTER, serves as a vital platform for advancing the field of semiconductor technology and materials science. With its ISSN 1598-1657 and E-ISSN 2233-4866, this journal has been pivotal since its inception in 2005, continuing to shed light on innovative research until 2024. Although currently classified in the Q4 category for both Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, it remains a crucial resource for those in industry and academia alike, providing in-depth analyses and findings that explore the complexities of semiconductor applications. Researchers and professionals will find value in its comprehensive articles that address current trends and future directions in semiconductor technologies. This open-access journal, published in South Korea, is positioned to foster collaboration among students, professionals, and leading researchers in the ever-evolving technology landscape.

IEEE Electronics Device Letters, published by the esteemed IEEE-Institute of Electrical and Electronics Engineers Inc, stands at the forefront of innovation in the field of electrical and electronic engineering. With a rich history spanning from 1980 to 2024, this journal showcases groundbreaking research and letters that significantly contribute to the advancement of electronic, optical, and magnetic materials. Its impressive Q1 rankings in both Electrical and Electronic Engineering and Electronic, Optical, and Magnetic Materials underscore its pivotal role in shaping contemporary academic discourse. The journal maintains a strong position in Scopus rankings, positioned within the top 16% for Electrical and Electronic Engineering and the top 18% for Materials Science, making it a vital resource for researchers, professionals, and students alike. With the absence of open access, it maintains an exclusive repository of high-impact research that experts in the field turn to for the latest insights and developments. IEEE Electronics Device Letters is committed to providing a platform for the dissemination of transformative knowledge that fuels innovation and progress in the ever-evolving landscape of electronics.

The International Journal of Reliability Quality and Safety Engineering, published by World Scientific Publishing Co Pte Ltd, is a leading platform for disseminating cutting-edge research in the fields of reliability, quality, and safety engineering. With an impressive scope that spans across aerospace, electrical engineering, nuclear energy, and industrial manufacturing, this journal serves as a critical resource for researchers and professionals aiming to enhance system dependability and operational excellence. Indexed in Scopus, it holds a respectable Q3 ranking across various categories in 2023, reflecting its growing influence in the academic community. Although currently not open access, it provides ample opportunities for scholars to publish impactful studies from its extensive database, which has evolved since 1996. The journal's commitment to advancing knowledge in reliability and safety engineering makes it a pivotal resource for those dedicated to improving engineering practices and protocols worldwide.

METALURGIJA is a distinguished open-access journal published by the Croatian Metallurgical Society, dedicated to advancing the field of metallurgical sciences and engineering. With an ISSN of 0543-5846 and E-ISSN of 1334-2576, this journal has been serving the academic community since its inception, offering valuable insights into condensed matter physics, materials chemistry, mechanics of materials, and metals and alloys. As of 2023, it ranks in Q3 in the fields of condensed matter physics, materials chemistry, and mechanics of materials, and Q2 in metals and alloys, reflecting its engagement with contemporary research and emerging trends. The journal's open-access policy, in place since 2002, ensures that high-quality research is accessible to a global audience, fostering collaboration and knowledge sharing. Located in Zagreb, Croatia, METALURGIJA aims to bring together researchers, industry professionals, and students alike to contribute to systemic advancements in metallurgical research and applications, ultimately enhancing innovation within the materials science community.

Integration - The VLSI Journal, published by Elsevier, stands as a significant contributor to the fields of Electrical and Electronic Engineering, Hardware and Architecture, and Software. With its ISSN 0167-9260 and E-ISSN 1872-7522, this journal caters to a global audience interested in cutting-edge research and advancements in Very Large Scale Integration (VLSI) technologies and methodologies. As of 2023, the journal is classified in the Q3 category in its respective fields, demonstrating its commitment to quality and relevance in engineering. Researchers, practitioners, and students can benefit from its rigorous peer-review process, which ensures the publication of high-impact studies and innovative findings within the engineering landscape. Boasting a converged history from 1983 to 2025, Integration - The VLSI Journal continues to foster scholarly exchange and collaboration, making it an essential resource for anyone aiming to stay at the forefront of VLSI research.

Journal of Failure Analysis and Prevention, published by SpringerNature, stands as a vital resource in the fields of Materials Science, Mechanical Engineering, and Safety, Risk, Reliability and Quality. With an ISSN of 1547-7029 and an E-ISSN of 1864-1245, this journal has been dedicated to advancing the understanding of failure mechanisms and prevention strategies since its inception in 2001. Its convergence of rigorous research from various domains underscores its importance, achieving a Q3 classification across multiple engineering categories as of 2023. As of the latest rankings, it holds significant positions, including #114 in Safety, Risk, Reliability and Quality and #408 in Mechanical Engineering, illustrating its role in fostering scholarly dialogue and innovation. Although it does not currently offer open-access options, the journal endeavors to be accessible for researchers and professionals seeking impactful, high-quality analyses that inform both safety practices and engineering improvements. Whether you are a researcher pushing the boundaries of knowledge or a professional applying these principles, the Journal of Failure Analysis and Prevention is an indispensable part of your academic toolkit.