The Journal of Semiconductor Technology and Science, published by the IEEK PUBLICATION CENTER, serves as a vital platform for advancing the field of semiconductor technology and materials science. With its ISSN 1598-1657 and E-ISSN 2233-4866, this journal has been pivotal since its inception in 2005, continuing to shed light on innovative research until 2024. Although currently classified in the Q4 category for both Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, it remains a crucial resource for those in industry and academia alike, providing in-depth analyses and findings that explore the complexities of semiconductor applications. Researchers and professionals will find value in its comprehensive articles that address current trends and future directions in semiconductor technologies. This open-access journal, published in South Korea, is positioned to foster collaboration among students, professionals, and leading researchers in the ever-evolving technology landscape.

Journal of Failure Analysis and Prevention, published by SpringerNature, stands as a vital resource in the fields of Materials Science, Mechanical Engineering, and Safety, Risk, Reliability and Quality. With an ISSN of 1547-7029 and an E-ISSN of 1864-1245, this journal has been dedicated to advancing the understanding of failure mechanisms and prevention strategies since its inception in 2001. Its convergence of rigorous research from various domains underscores its importance, achieving a Q3 classification across multiple engineering categories as of 2023. As of the latest rankings, it holds significant positions, including #114 in Safety, Risk, Reliability and Quality and #408 in Mechanical Engineering, illustrating its role in fostering scholarly dialogue and innovation. Although it does not currently offer open-access options, the journal endeavors to be accessible for researchers and professionals seeking impactful, high-quality analyses that inform both safety practices and engineering improvements. Whether you are a researcher pushing the boundaries of knowledge or a professional applying these principles, the Journal of Failure Analysis and Prevention is an indispensable part of your academic toolkit.

Journal of Reliability and Statistical Studies, published by RIVER PUBLISHERS, is a vital resource for researchers and professionals engaged in the fields of analysis, statistics, and numerical methods. With an ISSN of 0974-8024 and E-ISSN 2229-5666, this journal has carved a niche since its inception, converging from 2019 to 2024 to deliver cutting-edge research. The journal is recognized in the academic community, demonstrated by its rankings in Scopus: Mathematics (Analysis: Rank #108/193, Percentile 44; Statistics and Probability: Rank #170/278, Percentile 39; Numerical Analysis: Rank #58/88, Percentile 34). Despite being categorized as Q4 in its field for 2023, it aims to cultivate a robust platform for innovative studies that push the boundaries of reliability and statistical methodologies. Researchers will find value in its commitment to disseminating both theoretical and practical advancements, making it an essential journal for students and scholars striving for excellence in statistical analysis and reliability engineering.

The Japanese Journal of Applied Physics is a premier publication in the field of applied physics, offering a platform for researchers and professionals to present their findings and innovations. Published by IOP Publishing Ltd, this esteemed journal has been active since 1963 and continues to contribute significantly to the understanding and advancement of applied physics across diverse applications. The journal is recognized for its rigorous peer-review process and high-quality publications, evidenced by its 2023 ranking of Q2 in Engineering (Miscellaneous) and Q3 in Physics and Astronomy (Miscellaneous). With an accessible ISSN of 0021-4922 and E-ISSN 1347-4065, the journal cultivates a global readership, fostering collaboration and innovation within the scientific community. Although the journal does not currently offer open access options, its valuable insights into the latest technological advancements and theoretical developments remain crucial for students, researchers, and industry professionals alike. By bridging the gap between fundamental physics and practical applications, the Japanese Journal of Applied Physics plays a vital role in shaping the future of applied sciences in Japan and beyond.

QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL is a prestigious journal published by WILEY, dedicated to advancing the fields of quality, reliability, and engineering. With an ISSN of 0748-8017 and an E-ISSN of 1099-1638, this journal provides a platform for scholarly articles that delve into the intricacies of management science, operations research, safety, risk, reliability, and quality, as evidenced by its strong ranking in the Q2 category for both Management Science and Operations Research, as well as Safety, Risk, Reliability, and Quality. Established in 1985 and continuing through 2024, the journal has garnered a solid reputation in the academic community, achieving a Scopus ranking in the 70th and 64th percentiles for its respective categories. Although it does not offer open access, its authoritative content is essential for researchers, professionals, and students seeking to deepen their understanding of quality and reliability principles. With its UK-based publishing address ensuring global reach, this journal remains at the forefront of discussions surrounding engineering quality and reliability methodologies.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is a leading academic journal published by SPRINGER, dedicated to advancing the field of electronic testing through innovative research and applications. With an ISSN of 0923-8174 and an E-ISSN of 1573-0727, this journal plays a vital role in disseminating significant findings and methodologies that enhance the reliability and performance of electronic systems. Based in the Netherlands, with a prominent address at ONE NEW YORK PLAZA, SUITE 4600, NEW YORK, NY 10004, UNITED STATES, the journal covers a broad spectrum of topics related to electronic testing, making it essential reading for researchers, professionals, and students in the Electrical and Electronic Engineering domain. In the 2023 ranking, it holds a Category Quartile of Q3 and is ranked #495 out of 797 journals in Scopus, reflecting its contributions to the discipline. Although it does not provide open access options, readers and contributors can engage with high-caliber research from 1990 through to 2024, further emphasizing its commitment to the ongoing evolution of electronic testing methodologies.

The Journal of Machinery Manufacture and Reliability, published by PLEIADES PUBLISHING INC, serves as a pivotal platform for advancing knowledge in the fields of Industrial and Manufacturing Engineering, Mechanical Engineering, and Safety, Risk, Reliability, and Quality. Having adopted an Open Access model since 2015, this journal facilitates global dissemination of research findings and innovations, ensuring that critical developments in machinery manufacture resonate across the academic and professional spectrum. With its ISSN 1052-6188 and E-ISSN 1934-9394, it has established itself within established quartiles, notably Q3 in key engineering categories according to the 2023 metrics. Its Scopus rankings underscore its emerging impact, though it remains an area for growth, making it an excellent venue for early-career researchers aiming to contribute to a growing body of literature. The journal's commitment to high-quality, accessible research positions it as a must-read for academics and practitioners alike, fostering innovation and collaboration in the machinery manufacturing sector.

MICROELECTRONICS RELIABILITY, published by PERGAMON-ELSEVIER SCIENCE LTD, is a pivotal journal that serves the advancing field of microelectronics and materials reliability. With its ISSN 0026-2714 and E-ISSN 1872-941X, this journal has been at the forefront of disseminating research since its inception in 1962 and is set to continue exploring cutting-edge topics through 2024. The journal holds a respectable presence across several categories, achieving a Q3 ranking in areas such as Atomic and Molecular Physics and Electrical and Electronic Engineering, highlighting its broad interdisciplinary appeal, while also ranking in the Q2 category for Safety, Risk, Reliability, and Quality, which speaks to its commitment to ensuring standards in technological advancements. Access to this journal is subscription-based, making it an essential resource for researchers, professionals, and students seeking reliable information and data regarding electronic material performance and reliability assessment. Located in Kidlington, Oxford, UK, MICROELECTRONICS RELIABILITY is dedicated to advancing the field and addressing the critical issues associated with the reliability of microelectronic devices, thereby supporting innovations that shape our technological future.

Nondestructive Testing and Evaluation, published by Taylor & Francis Ltd, is a premier international journal dedicated to the dissemination of innovative research and practices in the field of nondestructive testing and evaluation. With a robust ISSN of 1058-9759 and an E-ISSN of 1477-2671, this journal has consistently served as a vital resource for researchers, professionals, and students interested in enhancing the safety and reliability of materials and structures through advanced testing techniques. The journal's significant impact, evidenced by its Q2 rankings across multiple categories—including Materials Science, Mechanical Engineering, and Physics and Astronomy, along with commendable Scopus rankings—reflects its commitment to high-quality scholarship. Covering the convergence of research from 1989 to 2024, Nondestructive Testing and Evaluation plays a crucial role in advancing methodologies that drive innovation in various engineering disciplines. While currently not offering an Open Access option, the journal remains a respected platform for exchanging knowledge that shapes the future of nondestructive methodologies.

MICROELECTRONICS INTERNATIONAL is a distinguished peer-reviewed journal published by Emerald Group Publishing Ltd, focusing on the expansive domains of microelectronics, materials science, and physics. With its ISSN 1356-5362 and E-ISSN 1758-812X, the journal has been a critical platform for researchers since its inception in 1982. Although it currently holds a Q4 category ranking across multiple disciplines such as Atomic and Molecular Physics, Electronic Engineering, and Surfaces, Coatings and Films, it remains committed to advancing scholarship and fostering dialogue within these fields. The journal's scope encompasses innovative research and developments that contribute to the understanding and technological evolution of microelectronic materials and systems. While it doesn't offer open access, its content is accessible through various academic databases, enabling a broad audience of professionals and enthusiasts to engage with high-quality research findings. As microelectronics continues to play a pivotal role in shaping modern technology, MICROELECTRONICS INTERNATIONAL serves as an essential resource for advancing knowledge and inspiring future innovations.