Integration - The VLSI Journal, published by Elsevier, stands as a significant contributor to the fields of Electrical and Electronic Engineering, Hardware and Architecture, and Software. With its ISSN 0167-9260 and E-ISSN 1872-7522, this journal caters to a global audience interested in cutting-edge research and advancements in Very Large Scale Integration (VLSI) technologies and methodologies. As of 2023, the journal is classified in the Q3 category in its respective fields, demonstrating its commitment to quality and relevance in engineering. Researchers, practitioners, and students can benefit from its rigorous peer-review process, which ensures the publication of high-impact studies and innovative findings within the engineering landscape. Boasting a converged history from 1983 to 2025, Integration - The VLSI Journal continues to foster scholarly exchange and collaboration, making it an essential resource for anyone aiming to stay at the forefront of VLSI research.

Advanced Electronic Materials is an esteemed journal published by Wiley, dedicated to the forefront of materials science, particularly in the areas of electronic, optical, and magnetic materials. With a commendable impact factor that places it in the Q1 quartile of its category and a Scopus rank of 36 out of 284, the journal is a vital resource for researchers, professionals, and students aiming to contribute to this rapidly evolving field. Launched in 2015 and fully transitioned to Open Access in 2023, the journal promotes widespread dissemination of knowledge, ensuring accessibility to groundbreaking research findings. With its address located in Germany at 111 River St, Hoboken 07030-5774, NJ, it serves a global academic community eager to explore innovative materials technologies that influence diverse applications ranging from consumer electronics to advanced manufacturing. As researchers seek to push the boundaries of what is possible with materials, Advanced Electronic Materials stands as a premier platform for sharing, discovering, and advancing knowledge in this essential domain.

IEEE Journal of the Electron Devices Society is a premier open-access publication dedicated to the advancement of knowledge in the field of electron devices. Published by the IEEE Institute of Electrical and Electronics Engineers Inc, this journal has been contributing essential research to the scientific community since 2013, reflecting its commitment to fostering innovation and development in the industry. With a notable impact factor that places it in reputable category quartiles—Q3 in Biotechnology and Q2 in both Electrical and Electronic Engineering and Electronic, Optical, and Magnetic Materials—this journal stands as a respected outlet for cutting-edge studies. Positioned among the top-ranked journals in its respective categories, including a Scopus rank of #90 in Electronic, Optical and Magnetic Materials, it serves as a vital resource for researchers, professionals, and students alike. The open-access model enhances the journal's accessibility, allowing for widespread dissemination of crucial findings and innovations in electron device technologies. Whether you are engaged in academia or industry, the IEEE Journal of the Electron Devices Society is essential for remaining at the forefront of advancements in this dynamic field.

IEEE Electronics Device Letters, published by the esteemed IEEE-Institute of Electrical and Electronics Engineers Inc, stands at the forefront of innovation in the field of electrical and electronic engineering. With a rich history spanning from 1980 to 2024, this journal showcases groundbreaking research and letters that significantly contribute to the advancement of electronic, optical, and magnetic materials. Its impressive Q1 rankings in both Electrical and Electronic Engineering and Electronic, Optical, and Magnetic Materials underscore its pivotal role in shaping contemporary academic discourse. The journal maintains a strong position in Scopus rankings, positioned within the top 16% for Electrical and Electronic Engineering and the top 18% for Materials Science, making it a vital resource for researchers, professionals, and students alike. With the absence of open access, it maintains an exclusive repository of high-impact research that experts in the field turn to for the latest insights and developments. IEEE Electronics Device Letters is committed to providing a platform for the dissemination of transformative knowledge that fuels innovation and progress in the ever-evolving landscape of electronics.

The Japanese Journal of Applied Physics is a premier publication in the field of applied physics, offering a platform for researchers and professionals to present their findings and innovations. Published by IOP Publishing Ltd, this esteemed journal has been active since 1963 and continues to contribute significantly to the understanding and advancement of applied physics across diverse applications. The journal is recognized for its rigorous peer-review process and high-quality publications, evidenced by its 2023 ranking of Q2 in Engineering (Miscellaneous) and Q3 in Physics and Astronomy (Miscellaneous). With an accessible ISSN of 0021-4922 and E-ISSN 1347-4065, the journal cultivates a global readership, fostering collaboration and innovation within the scientific community. Although the journal does not currently offer open access options, its valuable insights into the latest technological advancements and theoretical developments remain crucial for students, researchers, and industry professionals alike. By bridging the gap between fundamental physics and practical applications, the Japanese Journal of Applied Physics plays a vital role in shaping the future of applied sciences in Japan and beyond.

MICROELECTRONICS INTERNATIONAL is a distinguished peer-reviewed journal published by Emerald Group Publishing Ltd, focusing on the expansive domains of microelectronics, materials science, and physics. With its ISSN 1356-5362 and E-ISSN 1758-812X, the journal has been a critical platform for researchers since its inception in 1982. Although it currently holds a Q4 category ranking across multiple disciplines such as Atomic and Molecular Physics, Electronic Engineering, and Surfaces, Coatings and Films, it remains committed to advancing scholarship and fostering dialogue within these fields. The journal's scope encompasses innovative research and developments that contribute to the understanding and technological evolution of microelectronic materials and systems. While it doesn't offer open access, its content is accessible through various academic databases, enabling a broad audience of professionals and enthusiasts to engage with high-quality research findings. As microelectronics continues to play a pivotal role in shaping modern technology, MICROELECTRONICS INTERNATIONAL serves as an essential resource for advancing knowledge and inspiring future innovations.

PROGRESS IN PHOTOVOLTAICS, published by Wiley, is a leading scholarly journal dedicated to the advancement of photovoltaic technology and its applications. Since its inception in 1993, this journal has maintained a strong focus on the latest developments in solar energy, addressing both theoretical and practical aspects of photovoltaic systems. With an impressive impact factor and consistently ranked in the Q1 quartile across four key categories—Condensed Matter Physics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, and Renewable Energy, Sustainability, and the Environment—PROGRESS IN PHOTOVOLTAICS is regarded as a pillar of scholarly excellence. The journal is essential for researchers, professionals, and students who seek to stay at the forefront of innovations and sustainability in the energy sector. Although it does not primarily offer open access, its commitment to advancing the understanding of photovoltaic technologies ensures that readers can expect high-quality, peer-reviewed research that pushes the boundaries of current knowledge.

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS is a leading academic journal published by SPRINGER, dedicated to advancing the field of electronic testing through innovative research and applications. With an ISSN of 0923-8174 and an E-ISSN of 1573-0727, this journal plays a vital role in disseminating significant findings and methodologies that enhance the reliability and performance of electronic systems. Based in the Netherlands, with a prominent address at ONE NEW YORK PLAZA, SUITE 4600, NEW YORK, NY 10004, UNITED STATES, the journal covers a broad spectrum of topics related to electronic testing, making it essential reading for researchers, professionals, and students in the Electrical and Electronic Engineering domain. In the 2023 ranking, it holds a Category Quartile of Q3 and is ranked #495 out of 797 journals in Scopus, reflecting its contributions to the discipline. Although it does not provide open access options, readers and contributors can engage with high-caliber research from 1990 through to 2024, further emphasizing its commitment to the ongoing evolution of electronic testing methodologies.

Materials Performance and Characterization is a distinguished journal published by the American Society for Testing and Materials (ASTM), specializing in the field of materials science. With ISSN 2379-1365 and E-ISSN 2165-3992, this journal serves as a pivotal platform for disseminating innovative research in the areas of metals and alloys, polymers and plastics, ceramics and composites, and mechanics of materials. Established in 2012, it continues to feature peer-reviewed articles that contribute to both theoretical advancements and practical applications, emphasizing the importance of materials performance in various industries. Despite its current Q4 and Q3 rankings across categories as of 2023, the journal is committed to enhancing its influence in the materials science community, fostering engagement among researchers, professionals, and students alike. The journal is essential for anyone seeking to stay at the forefront of materials research and characterization.

Journal of Failure Analysis and Prevention, published by SpringerNature, stands as a vital resource in the fields of Materials Science, Mechanical Engineering, and Safety, Risk, Reliability and Quality. With an ISSN of 1547-7029 and an E-ISSN of 1864-1245, this journal has been dedicated to advancing the understanding of failure mechanisms and prevention strategies since its inception in 2001. Its convergence of rigorous research from various domains underscores its importance, achieving a Q3 classification across multiple engineering categories as of 2023. As of the latest rankings, it holds significant positions, including #114 in Safety, Risk, Reliability and Quality and #408 in Mechanical Engineering, illustrating its role in fostering scholarly dialogue and innovation. Although it does not currently offer open-access options, the journal endeavors to be accessible for researchers and professionals seeking impactful, high-quality analyses that inform both safety practices and engineering improvements. Whether you are a researcher pushing the boundaries of knowledge or a professional applying these principles, the Journal of Failure Analysis and Prevention is an indispensable part of your academic toolkit.