SENSORS AND MATERIALS is a pivotal academic journal dedicated to the dissemination of research in the fields of instrumentation and materials science. Published by MYU, SCIENTIFIC PUBLISHING DIVISION in Japan, this open-access journal has been fostering innovative research since its inception in 1996. With an ISSN of 0914-4935, it serves as a platform for the scholarly communication of studies that intertwine the developments in sensor technology and materials engineering. As of 2023, it occupies a respectable position in the category quartiles, ranking Q3 in both Instrumentation and Materials Science (miscellaneous), reflecting its commitment to quality research. The journal's Scopus rankings further highlight its relevance, being placed at Rank #317 in General Materials Science and Rank #105 in Instrumentation. With its open-access model, SENSORS AND MATERIALS ensures widespread availability of cutting-edge research that is critical for researchers, professionals, and students engaged in advancing the fields of sensor technologies and material innovations.

Nondestructive Testing and Evaluation, published by Taylor & Francis Ltd, is a premier international journal dedicated to the dissemination of innovative research and practices in the field of nondestructive testing and evaluation. With a robust ISSN of 1058-9759 and an E-ISSN of 1477-2671, this journal has consistently served as a vital resource for researchers, professionals, and students interested in enhancing the safety and reliability of materials and structures through advanced testing techniques. The journal's significant impact, evidenced by its Q2 rankings across multiple categories—including Materials Science, Mechanical Engineering, and Physics and Astronomy, along with commendable Scopus rankings—reflects its commitment to high-quality scholarship. Covering the convergence of research from 1989 to 2024, Nondestructive Testing and Evaluation plays a crucial role in advancing methodologies that drive innovation in various engineering disciplines. While currently not offering an Open Access option, the journal remains a respected platform for exchanging knowledge that shapes the future of nondestructive methodologies.

JOURNAL OF EDUCATIONAL MEASUREMENT, published by WILEY, stands as a pivotal resource in the fields of education and psychology, with a strong emphasis on the systematic evaluation of educational processes and instruments. With the ISSN 0022-0655 and E-ISSN 1745-3984, this journal has been contributing to the literature since 1964 and continues to thrive into 2024, reflecting its long-standing dedication to improving educational measurement practices. The journal holds impressive standings with 2023 category quartiles of Q1 in Education and Q2 in multiple psychology categories, demonstrating its significance in applied psychological research and educational development. Although it does not currently offer open access, its well-curated content appeals to researchers, professionals, and students seeking insights into measurement theories, practices, and innovations. With robust metrics, including a diverse range of Scopus ranks across various psychological disciplines, the JOURNAL OF EDUCATIONAL MEASUREMENT is indispensable for anyone looking to advance their knowledge and application of educational assessments and methodologies.

NDT & E International, published by Elsevier Science Ltd., stands as a preeminent journal in the fields of Condensed Matter Physics, Materials Science, and Mechanical Engineering. With an impressive 2023 impact factor, the journal is recognized in Q1 quartiles, reflecting its significant contributions and influence within these disciplines. As an essential platform for disseminating cutting-edge research, NDT & E International facilitates the exploration of non-destructive testing and evaluation methodologies, and thus is pivotal for professionals and researchers dedicated to advancing materials characterization and integrity assessments. Operating from the United Kingdom, the journal's commitment to high-quality research outputs underscores its esteemed position, as evidenced by its notable Scopus rankings across multiple categories. While access to articles is not open, the journal offers an extensive repository of knowledge vital for academia and industry alike, making it an invaluable resource for those engaged in the forefront of engineering and materials science research.

Journal of Measurement and Evaluation in Education and Psychology-EPOD is a distinguished open-access journal published by the ASSOCIATION FOR MEASUREMENT & EVALUATION IN EDUCATION & PSYCHOLOGY since 2010, based in Ankara, Turkey. Focusing on the critical intersections of education and psychology, this journal aims to disseminate valuable research that enhances assessments and evaluation methodologies across diverse educational settings. With a commitment to advancing knowledge, it explores a broad range of topics pertaining to developmental and educational psychology, making it an essential resource for researchers, professionals, and students alike. Despite its recent challenges, highlighted by its Q4 categorization in both Developmental and Educational Psychology and Education, the journal continues to provide a platform for innovative ideas and discussions crucial to shaping future educational practices. Access the latest findings and contribute to the field through this vital scholarly outlet.

Automated Software Engineering is a premier journal dedicated to advancing the field of software engineering through the exploration of innovative methodologies, tools, and applications. Published by Springer since its inception in 1994, this journal has established itself as a vital resource for researchers, industry professionals, and students alike, providing insights into the latest trends and technological advancements. With an impressive impact factor and currently ranked in the Q2 quartile of the Software category, it is recognized for its contribution to the discipline. The journal covers a broad scope of topics including automation in software development, empirical studies, and theoretical advancements, fostering discussions that bridge academia and industry. As we look forward to converging towards the year 2024, the journal continues to invite high-quality submissions that challenge existing paradigms and pave the way for future innovations in software engineering.

Educational Measurement-Issues and Practice, published by WILEY, stands as a premier journal in the field of education, recognized for its commitment to advancing understanding of measurement issues and methodologies in educational contexts. Established in 1982, this journal spans over four decades of scholarly contributions, maintaining a remarkable Q1 status within the Education category as per the 2023 metrics, and ranking #407 out of 1543 in Scopus's Education domain, placing it in the top 73rd percentile. It features a range of articles that address critical issues concerning educational assessment practices, policy implications, and innovative measurement methodologies, aimed at professionals, researchers, and students dedicated to enhancing educational assessment frameworks. With its ongoing focus on contemporary challenges and developments in the field, Educational Measurement-Issues and Practice plays a crucial role in shaping effective educational policies and practices worldwide, making it an essential resource for anyone involved in educational research and measurement.

MICROELECTRONICS RELIABILITY, published by PERGAMON-ELSEVIER SCIENCE LTD, is a pivotal journal that serves the advancing field of microelectronics and materials reliability. With its ISSN 0026-2714 and E-ISSN 1872-941X, this journal has been at the forefront of disseminating research since its inception in 1962 and is set to continue exploring cutting-edge topics through 2024. The journal holds a respectable presence across several categories, achieving a Q3 ranking in areas such as Atomic and Molecular Physics and Electrical and Electronic Engineering, highlighting its broad interdisciplinary appeal, while also ranking in the Q2 category for Safety, Risk, Reliability, and Quality, which speaks to its commitment to ensuring standards in technological advancements. Access to this journal is subscription-based, making it an essential resource for researchers, professionals, and students seeking reliable information and data regarding electronic material performance and reliability assessment. Located in Kidlington, Oxford, UK, MICROELECTRONICS RELIABILITY is dedicated to advancing the field and addressing the critical issues associated with the reliability of microelectronic devices, thereby supporting innovations that shape our technological future.

Journal of Measurements in Engineering is a pioneering open access journal dedicated to the crucial intersection of engineering and measurement technologies, published by JVE INT LTD in Lithuania. Since its transition to open access in 2018, the journal has significantly contributed to the field by providing a platform for disseminating innovative research findings and advances. With a focus on instrumentation, materials science, and mechanical engineering, it has established itself as a valuable resource for researchers, professionals, and students alike, offering insights that bridge theoretical concepts with practical applications. While currently holding a Q4 ranking in Instrumentation and Q3 ranks in both Materials Science (miscellaneous) and Mechanical Engineering, the journal encourages submissions that challenge existing paradigms and extend the boundaries of conventional measurements. As part of its commitment to fostering open scholarly communication, the journal accepts contributions reflecting a wide range of measurement methodologies and engineering applications up to the year 2024. By engaging with a global audience of practitioners and academics, the Journal of Measurements in Engineering underscores the vitality of precise measurement techniques in advancing engineering disciplines.

IEEE Transactions on Device and Materials Reliability stands as a leading journal in the field of reliability engineering, specializing in the intricate connections between device performance and materials efficacy. Published by the renowned IEEE-Institute of Electrical and Electronics Engineers Inc., this journal boasts a commendable impact factor and exhibits robust Scopus rankings across various categories, including electrical and electronic engineering and safety, risk, reliability, and quality. With a publication timeline from 2001 to 2024, it serves as an essential resource for researchers and professionals alike, providing comprehensive insights into current advancements and challenges in device reliability and materials science. Although it operates under a subscription model, the journal's extensive contributions are crucial for fostering significant innovations that ensure the integrity and longevity of electronic devices in a rapidly evolving technological landscape. Researchers, professionals, and students delving into this vital domain will find IEEE Transactions on Device and Materials Reliability a valuable platform to disseminate their findings and explore the latest trends.