Surface Topography-Metrology and Properties is an esteemed journal published by IOP Publishing Ltd, dedicated to advancing the field of surface metrology and its interrelation with material properties. With an ISSN of 2051-672X, this journal serves as a pivotal platform for researchers, professionals, and students engaged in the study of surfaces and coatings, particularly in disciplines such as Instrumentation, Materials Chemistry, and Process Chemistry and Technology. The journal maintains a strong academic presence with notable Category Quartile rankings, including Q2 in Materials Chemistry and Surfaces, Coatings and Films, and Q3 in other relevant fields. Although the journal operates under a subscription model, it offers valuable insights and findings that are crucial for advancing technologies reliant on surface characteristics and functionalities. Since its inception in 2013, the journal has continued to publish high-quality research up to the present day, catering to the ongoing needs of the scientific community and contributing significantly to the discourse in surface science.

Proceedings of the ACM on Measurement and Analysis of Computing Systems, published by the Association for Computing Machinery, is a pivotal journal in the realms of Computer Science and Engineering, particularly esteemed for its comprehensive focus within the fields of Computer Networks and Communications, Hardware and Architecture, and Safety, Risk, Reliability and Quality. With an impactful presence since its convergence in 2019—and now spanning from 2021 to 2024—this journal upholds rigorous standards, reflected in its classification as Q1 in Computer Science (miscellaneous) and in key safety-related categories. Researchers and professionals will find the journal's emphasis on measurement and analytical solutions critical for advancing computational efficiency and system reliability in real-world applications. The journal does not currently have open access, maintaining its academic rigor and exclusive content that aims to serve the tech-savvy community dedicated to exploring and addressing the challenges within modern computing systems. With Scopus rankings demonstrating a steady impact in the field, particularly recognised within safety and reliability domains, the Proceedings of the ACM stands as an indispensable resource for those seeking to deepen their expertise and contribute to the evolving landscape of computing research.

METROLOGIA is a premier journal published by IOP Publishing Ltd, dedicated to the field of metrology and its related disciplines. Established in 1965, it has served as a vital platform for disseminating high-quality research and advancements in measurement science, fostering innovation in engineering applications. The journal holds a notable Q2 ranking in the Engineering (miscellaneous) category and ranks #128 out of 307 in the general engineering category according to Scopus, placing it in the 58th percentile among its peers. Its impact within the academic community is underscored by its comprehensive scope, which covers theoretical developments, methods, and practical applications in metrology. Researchers, professionals, and students are encouraged to explore its rich repository of literature, which aims to promote understanding and collaboration across various engineering fields. With its continuous publication until 2024, METROLOGIA remains an essential resource for those seeking to stay at the forefront of measurement technologies and methodologies.

IEEE Antennas and Propagation Magazine, published by the IEEE Institute of Electrical and Electronics Engineers Inc, is a prestigious journal renowned for its impactful contributions to the fields of Condensed Matter Physics and Electrical and Electronic Engineering. With an impressive 2023 impact factor, this journal holds significant rankings as part of the Q1 quartile in both fields, reflecting its rigorous peer-review process and the high quality of published research. Spanning from 1990 to 2024, it features a wide range of articles including theoretical research, comprehensive reviews, and practical applications in antenna design and propagation. Though it does not offer open access, the magazine remains a vital resource for researchers, professionals, and students seeking cutting-edge insights and advancements in electromagnetic theory and related technologies. Located in the United States, IEEE Antennas and Propagation Magazine is dedicated to fostering innovation and collaboration within the global scientific community, showcasing essential studies that advance the understanding of wave propagation and antenna technology.

The Ukrainian Metrological Journal is a vital publication within the field of metrology, managed by the esteemed NATL SCIENTIFIC CENTER INST METROLOGY in Ukraine. With a focus on disseminating impactful research, the journal aims to foster advancements in measurement science and technology. Notably, this journal operates under an Open Access model, ensuring that the latest findings are readily available to a global audience, thus facilitating collaboration and innovation. Its ISSN 2306-7039 and E-ISSN 2522-1345 indicate its commitment to maintaining rigorous publishing standards. The Ukrainian Metrological Journal serves as a platform for researchers, professionals, and students to share insights, methodologies, and applications relevant to the evolving challenges in metrology, thereby elevating the discourse and practice within this crucial scientific field.

Applied Optics, published by Optica Publishing Group, is a prestigious journal dedicated to the field of optics and photonics. With an ISSN of 1559-128X and an E-ISSN of 2155-3165, this journal serves as a critical platform for researchers, professionals, and students eager to disseminate innovative findings and advancements in applied optics. Established in 1962, it has maintained a significant presence in the academic community, currently holding a Q2 category ranking in various disciplines including Atomic and Molecular Physics, Electrical and Electronic Engineering, and Miscellaneous Engineering as per the 2023 metrics. The journal's reputation is underscored by its solid Scopus rankings, attesting to its influential research output. While not an open-access journal, it continues to offer vital insights and discussions on the latest research topics that are critical to the advancement of technologies in optics, ensuring accessibility to vital knowledge for those within the field.

MEASUREMENT is a premier academic journal published by Elsevier Science Ltd, dedicated to advancing research in the fields of Applied Mathematics, Condensed Matter Physics, Electrical and Electronic Engineering, Statistics, and Instrumentation. With an impressive Q1 ranking in multiple categories as of 2023, MEASUREMENT stands out with its strong impact factor, indicative of its high-quality contributions to interdisciplinary research. Since its inception in 1983, the journal has maintained a commitment to publishing innovative methodologies, cutting-edge technologies, and significant advances in measurement science. Although currently not an Open Access publication, the journal provides vital access options through institutional subscriptions, ensuring that researchers, professionals, and students can delve into a wealth of knowledge throughout its pages, including both theoretical and practical applications. The journal’s rigorous peer-review process ensures that only the highest quality research is disseminated, making it an essential resource for anyone involved in quantitative analysis and measurement in diverse scientific domains.

MEASUREMENT SCIENCE and TECHNOLOGY is a premier journal published by IOP Publishing Ltd that delves into the critical intersection of measurement science and engineering applications. With a robust focus on innovative measurement techniques, instrumentation, and applied mathematics, this journal has established itself as a vital resource for researchers and professionals striving to advance the field. Recognized for its scholarly impact, it maintains an impressive impact factor and is categorized in the Q2 quartile across Applied Mathematics, Engineering (miscellaneous), and Instrumentation, demonstrating its significant contribution to these disciplines. The journal is indexed in prominent databases, including Scopus, where it ranks 122 out of 635 in Applied Mathematics and holds the 56th position in Engineering (miscellaneous). Spanning from 1990 to 2024, MEASUREMENT SCIENCE and TECHNOLOGY offers a wealth of rigorous peer-reviewed articles that not only support academic inquiry but also inform practical applications in measurement technology. Located in the United Kingdom, the journal serves as a collaborative platform for the global research community, inviting contributions that shape the future of measurement science.

FLOW MEASUREMENT AND INSTRUMENTATION, published by Elsevier Science Ltd, serves as a vital resource for researchers and professionals in the fields of Instrumentation, Electrical and Electronic Engineering, Computer Science Applications, and Modeling and Simulation. With an impressive trajectory since its inception in 1989 and extending to 2024, this journal has gained a notable reputation, ranking in the upper quartiles of various categories within the 2023 Scopus metrics, reflecting its significant contribution to advancing knowledge in flow measurement technologies and methodologies. Although it does not offer Open Access options, the journal is well-regarded for its rigorous peer-review process, ensuring high-quality, impactful research dissemination. The journal's emphasis on empirical studies and innovative instrument design establishes it as an essential platform for disseminating cutting-edge findings that facilitate practical applications and inform future research directions. Positioned within the United Kingdom, it attracts a global readership dedicated to the continuous enhancement of measurement sciences and engineering innovations.

RADIATION MEASUREMENTS is a highly regarded academic journal published by Pergamon-Elsevier Science Ltd, focusing on the interdisciplinary field of radiation science and instrumentation. With an ISSN of 1350-4487 and an E-ISSN of 1879-0925, this journal aims to disseminate cutting-edge research and practical advancements from 1994 to 2024. It holds a commendable position in the Scopus rankings, being categorized in the top quartiles (Q2) for both Instrumentation and Radiation, reflecting its significance in the scientific community with a notable percentile of 64th and 59th, respectively. Although it does not offer Open Access options, the journal serves as a vital resource for researchers, professionals, and students seeking to explore innovations that shape the understanding and measurement of radiation phenomena. With a commitment to high-quality research, RADIATION MEASUREMENTS continues to contribute essential knowledge in the fields of physics and astronomy, positioning itself as a key publication for those dedicated to advancing radiation technology and its applications.