Journal of Micro-Nanopatterning Materials and Metrology-JM3
metrics 2024
Advancing the Frontiers of Micro-Nanopatterning and Metrology
Introduction
Journal of Micro-Nanopatterning Materials and Metrology (JM3), published by SPIE - The International Society for Optics and Photonics, is a premier forum for advancing knowledge within the realms of micro-nanopatterning and metrology. With an ISSN of 1932-5150 and an E-ISSN of 2708-8340, JM3 has established itself as a valuable resource since its inception in 2007, converging critical research toward 2024. The journal has recently achieved recognition in various scientific domains, holding a Q3 category in fields such as Atomic and Molecular Physics, Condensed Matter Physics, and Nanoscience, while also being placed in Q2 for Mechanical Engineering in 2023. Given its multifaceted focus, JM3 engages a wide audience, including engineers, physicists, and materials scientists, facilitating a dialogue that bridges theoretical and practical innovations. Open access options enable broader dissemination of research findings, enhancing visibility and impact. By continually striving to publish cutting-edge research and methodologies, JM3 plays a crucial role in shaping the future of material sciences and engineering practices.
Metrics 2024
Metrics History
Rank 2024
Scopus
IF (Web Of Science)
JCI (Web Of Science)
Quartile History
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